| Considering the importance of blast, caused by Pyricularia oryzae, to reduce wheat yield, this study investigate how silicon (Si) could reduce the wheat blast symptoms in the rachis tissues using light microscopy and scanning electron microscopy. Wheat plants (cv. BR 18) were grown in hydroponic culture with either 0 (–Si) or 2 mM (+Si) of Si. Blast symptoms were very well developed on the spikes of the –Si plants, which showed intense discoloration in contrast with the spikes of the +Si plants. At 72 hours after inoculation (hai), fungal hyphae extensively colonized the epidermis and the collenchyma tissue in the radial direction in the rachis of the –Si plants. In the +Si plants, fungal hyphae colonized the epidermis and the collenchyma cells to a lesser... |
